A brief review of mathematical models of thin film growth and surfaces

The morphology of thin films has been extensively studied in the last years. The properties of a thin film are closely related to its microstructure, especially to its morphology and surface roughness. Optical reflectivity, conductivity, and porosity are characteristics that depend on the film structure. The knowledge of atomistic details of the thin film growth process is useful for the development of new techniques and the control of thin films and new materials. Models of growth process are very powerful tools that can help researchers to predict and control physical, chemical, and mechanical properties. In this work we briefly summarize the theoretical models that have been used in the studies of thin films growth. By describing the deposition process of atoms/molecules on the surface of the substrate, one can study the evolution of the bulk and the surface roughness of a thin film. If an experimental growth process is appropriately described by a theoretical model (or even a combination of one or more different models), it can also provide indications to control the surface roughness and porosity of the film. Controlling the growth process one can obtain materials with a set of desired properties, namely tribological, porosity, and electrical ones. These characteristics are necessary for example, for hosting a solid lubricant on the surface of the material. We believe that the models presented in this work can be very useful in understanding the mechanisms of control and adherence of electrodeposited films which are commonly used in medical applications such as stent devices. We also believe that the models can be helpful to the understanding surface problems related to the superficial defects in stents.